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008 100301s2008 xxu| s |||| 0|eng d
020 _a9780387779508
024 7 _a10.1007/978-0-387-77950-8
_2doi
035 _a978-0-387-77950-8
072 7 _aPBT
_2bicssc
072 7 _aPD
_2bicssc
072 7 _aMAT029000
_2bisacsh
082 0 4 _a519.5
090 _amg
100 1 _aHamada, Michael S.
_99119
245 1 0 _aBayesian Reliability
_h[electronic resource]/
_cby Michael S. Hamada, Alyson G. Wilson, C. Shane Reese, Harry F. Martz.
260 _aNew York:
_bSpringer New York,
_c2008.
300 _bdigital.
490 0 _aSpringer Series in Statistics,
_x0172-7397
520 _aBayesian Reliability presents modern methods and techniques for analyzing reliability data from a Bayesian perspective. The adoption and application of Bayesian methods in virtually all branches of science and engineering have significantly increased over the past few decades. This increase is largely due to advances in simulation-based computational tools for implementing Bayesian methods. The authors extensively use such tools throughout this book, focusing on assessing the reliability of components and systems with particular attention to hierarchical models and models incorporating explanatory variables. Such models include failure time regression models, accelerated testing models, and degradation models. The authors pay special attention to Bayesian goodness-of-fit testing, model validation, reliability test design, and assurance test planning. Throughout the book, the authors use Markov chain Monte Carlo (MCMC) algorithms for implementing Bayesian analyses--algorithms that make the Bayesian approach to reliability computationally feasible and conceptually straightforward. This book is primarily a reference collection of modern Bayesian methods in reliability for use by reliability practitioners. There are more than 70 illustrative examples, most of which utilize real-world data. This book can also be used as a textbook for a course in reliability and contains more than 160 exercises. Noteworthy highlights of the book include Bayesian approaches for the following: Goodness-of-fit and model selection methods Hierarchical models for reliability estimation Fault tree analysis methodology that supports data acquisition at all levels in the tree Bayesian networks in reliability analysis Analysis of failure count and failure time data collected from repairable systems, and the assessment of various related performance criteria Analysis of nondestructive and destructive degradation data Optimal design of reliability experiments Hierarchical reliability assurance testing Dr. Michael S. Hamada is a Technical Staff Member in the Statistical Sciences Group at Los Alamos National Laboratory and is a Fellow of the American Statistical Association. Dr. Alyson G. Wilson is a Technical Staff Member in the Statistical Sciences Group at Los Alamos National Laboratory. Dr. C. Shane Reese is an Associate Professor in the Department of Statistics at Brigham Young University. Dr. Harry F. Martz is retired from the Statistical Sciences Group at Los Alamos National Laboratory and is a Fellow of the American Statistical Association .
650 0 _aStatistics.
_943790
650 0 _aMathematical statistics
_943558
650 0 _aSystem safety
_98873
650 1 4 _aStatistics.
_943790
650 2 4 _aStatistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences
_99120
650 2 4 _aQuality Control, Reliability, Safety and Risk
_98876
650 2 4 _aStatistical Theory and Methods
_99105
697 _aMatemáticas Gerais-
_x(inclusive alguns textos elementares sobre assuntos específicos)
_923752
700 0 _aWilson, Alyson G.
_99121
700 1 _aReese, C. Shane
_99122
700 1 _aMartz, Harry F.
_q(Harry Franklin)
_938956
710 1 _aSpringerLink (Online service).
_98857
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387779485
830 0 _aSpringer series in statistics.
_944309
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-387-77950-8
942 _2impa
_cEBK
999 _aHAMADA, Michael S.; WILSON, Alyson G; REESE, C. Shane; MARTZ, Harry F. <b> Bayesian Reliability. </b> New York: Springer New York, 2008. (Springer Series in Statistics, 0172-7397). ISBN 9780387779508. Disponível em: <http://dx.doi.org/10.1007/978-0-387-77950-8 >
_c38520
_d38520