Results of search for 'su:"Reliability"'

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	1.	Reliability in the acquisitions process/ edited by Douglas J. DePriest, Robert L. Launer. by DePriest, Douglas J, 1944- Launer, Robert L Series: Lecture notes in statistics (Marcel Dekker, Inc.) ; v. 4. Publication details: New York: M. Dekker, c1983 Availability: Items available for loan: Castorina (1)Call number: 519 R382 1983 IMPA. Found in Open Library: Place hold Add to cart (remove)
	2.	Quality control and reliability/ edited by P. R. Krishnaiah, C. R. Rao. by Krishnaiah, Paruchuri R Rao, C. Radhakrishna (Calyampudi Radhakrishna), 1920- Series: Handbook of statistics ; v. 7. Publication details: Amsterdam; New York: New York: North-Holland, Sole distributors for the U.S.A. and Canada, Elsevier Science, 1988 Availability: Items available for reference: Castorina: Not For Loan (1). Found in Open Library: Add to cart (remove)
	3.	No cover image available No cover image available No cover image available Reliability and fault tree analysis: theoretical and applied aspects of system reliability and safety assessment : papers/ edited by Richard E. Barlow, Jerry B. Fussell, and Nozer D. Singpurwalla. by Barlow, Richard E Fussell, Jerry B Singpurwalla, Nozer D Birnbaum, Zygmunt William, 1903- Lawrence Livermore Laboratory California. University. Office of Naval Research California. University. Operations Research Center Conference on Reliability and Fault Tree Analysis, University of California (1974 : Berkeley) Publication details: Philadelphia: Society for Industrial and Applied Mathematics, 1975 Availability: Items available for loan: Castorina (2)Call number: 620 R382 1975 IMPA, ... Found in Open Library: Place hold Add to cart (remove)
	4.	Statistical analysis of reliability data/ M. J. Crowder ... [et al.]. by Crowder, M. J. (Martin J.), 1943- Edition: 1st ed. Publication details: London; New York: Chapman & Hall, 1991 Availability: Items available for loan: Castorina (1)Call number: 519.5 S797 1991 IMPA. Found in Open Library: Place hold Add to cart (remove)
	5.	Reliability in computing: the role of interval methods in scientific computing/ edited by Ramon E. Moore. by Moore, Ramon E Series: Perspectives in computing (Boston, Mass.) ; vol. 19. Publication details: Boston: Academic Press, c1988 Availability: Items available for loan: Castorina (1)Call number: 518 R382 1988 IMPA. Found in Open Library: Place hold Add to cart (remove)
	6.	Developments in reliable computing/ edited by Tibor Csendes. by Csendes, Tibor International Symposium on Scientific Computing, Computer Arithmetic, and Validated Numerics (1998: Szeged, Hungary) Publication details: Boston: Kluwer Academic, 1999 Availability: Items available for loan: Castorina (1)Call number: 004 D489 1999 IMPA. Found in Open Library: Place hold Add to cart (remove)
	7.	Accuracy and reliability in scientific computing/ edited by Bo Einarsson. by Einarsson, Bo, 1939- Series: Software, environments, tools Publication details: Philadelphia: Society for Industrial and Applied Mathematics, c2005 Availability: Items available for loan: Castorina (1)Call number: 502.85 A172 2005 IMPA. Found in Open Library: Place hold Add to cart (remove)
	8.	Recent advances in reliability theory: methodology, practice, and inference/ N. Limnios, M. Nikulin, editors. by Limnios, N. (Nikolaos) Nikulin, M. S. (Mikhail Stepanovich) Series: Statistics for industry and technology Publication details: Boston: Birkhauser, c2000 Availability: Items available for loan: Castorina (1)Call number: 519.5 R295 2000 IMPA. Found in Open Library: Place hold Add to cart (remove)
	9.	Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert. by Chan, H. Anthony, 1952- Englert, Paul J, 1960- John Wiley & Sons [publisher.] IEEE Xplore (Online service) [distributor.] Material type: Text; Format: available online ; Literary form: Not fiction Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	10.	Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.]. by Strong, Alvin Wayne, 1946- IEEE Xplore (Online Service) [distributor.] Wiley [publisher.] Series: IEEE Press Series on Microelectronic Systems ; 12 Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009 Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	11.	No cover image available No cover image available No cover image available Dependability benchmarking for computer systems / edited by Karama Kanoun, Lisa Spainhower. by Kanoun, Karama Spainhower, Lisa IEEE Xplore (Online Service) [distributor.] John Wiley & Sons [publisher.] Series: Practitioners ; 72 Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2008] Online access: Abstract with links to resource Availability: No items available. Add to cart (remove)
	12.	Design for reliability / edited by Dev Raheja, Louis J. Gullo. by Raheja, Dev Gullo, Louis J IEEE Xplore (Online Service) [distributor.] Wiley [publisher.] Series: Quality and reliability engineering series Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley, 2012Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	13.	Statistical analysis of reliability and life-testing models: theory and methods/ Lee J. Bain. by Bain, Lee J, 1939- Series: Statistics, textbooks and monographs ; v. 24. Publication details: New York: M. Dekker, c1978 Availability: Items available for loan: Castorina (1)Call number: 519.5 B162s 1978 IMPA. Found in Open Library: Place hold Add to cart (remove)
	14.	No cover image available No cover image available No cover image available Mathematical theory of reliability/ [by] Richard E. Barlow [and] Frank Proschan, with contributions by Larry C. Hunter. by Barlow, Richard E Proschan, Frank, 1921- [joint author.] Series: SIAM studies in applied mathematics Publication details: New York: Wiley, [1965] Availability: Items available for loan: Castorina (1)Call number: 519. B258m 1965 IMPA. Found in Open Library: Place hold Add to cart (remove)
	15.	Statistical theory of reliability and life testing: probability models/ Richard E. Barlow, Frank Proschan. by Barlow, Richard E Proschan, Frank, 1921- Series: International series in decision processes Publication details: New York London: Holt, Rinehart and Winston, 1975 Availability: Items available for loan: Castorina (1)Call number: 519.5 B258s 1975 IMPA. Found in Open Library: Place hold Add to cart (remove)
	16.	Practical system reliability / Eric Bauer, Xuemei Zhang, Douglas A. Kimber. by Bauer, Eric [author.] Zhang, Xuemei [aut ] Kimber, Douglas A [aut ] John Wiley & Sons [publisher.] IEEE Xplore (Online service) [distributor.] Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	17.	Design for reliability : information and computer-based systems / Eric Bauer. by Bauer, Eric [author.] John Wiley & Sons [publisher.] IEEE Xplore [distributor.] Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley-IEEE Press, c2010Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	18.	Beyond redundancy : how geographic redundancy can improve service availability and reliability of computer-based systems / Eric Bauer, Randee Adams, Dan Eustace. by Bauer, Eric [author.] Adams, Randee Eustace, Dan IEEE Xplore (Online Service) [distributor.] John Wiley & Sons [publisher.] Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley-IEEE Press, 2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	19.	Service quality of cloud-based applications / Eric Bauer, Randee Adams. by Bauer, Eric [auteur.] Adams, Randee [auteur.] IEEE Xplore (Online Service) [distributor.] Wiley [publisher.] Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley, [2014]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2013] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	20.	Trustworthy systems through quantitative software engineering / Lawrence Bernstein, Christine M. Yuhas. by Bernstein, Lawrence, 1940- Yuhas, C. M IEEE Xplore (Online Service) [distributor.] Wiley InterScience (Online service) [publisher.] Series: Quantitative software engineering series ; 1 Material type: Text; Format: available online Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)

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Your search returned 46 results.