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1.
Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi. by
  • Montrose, Mark I [author.]
  • Nakauchi, Edward M
  • IEEE Xplore (Online Service) [distributor.]
  • John Wiley & Sons [publisher.]
Material type: Text Text; Format: available online remote
Publisher: Hoboken, New Jersey : John Wiley, 2004Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2004]
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2.
Radio frequency principles and applications : the generation, propagation, and reception of signals and noise / Albert A. Smith, Jr. by
  • Smith, Albert A, 1935-
  • John Wiley & Sons [publisher.]
  • IEEE Xplore (Online service) [distributor.]
Series: IEEE Press/Chapman & Hall Publishers series on microwave technology and RF ; 3
Material type: Text Text; Format: available online remote
Publisher: New York : IEEE Press, 1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]
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3.
Chaos analysis and chaotic EMI suppression of DC-DC converters / Bo Zhang, Xuemei Wang. by
  • Zhang, Bo, 1962 January-
  • Wang, Xuemei (Electrical engineer)
  • IEEE Xplore (Online Service) [distributor.]
  • Wiley [publisher.]
Material type: Text Text; Format: available online remote
Publisher: Singapore : John Wiley & Sons, Inc., 2014Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2015]
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