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	1.	Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.]. by Strong, Alvin Wayne, 1946- IEEE Xplore (Online Service) [distributor.] Wiley [publisher.] Series: IEEE Press Series on Microelectronic Systems ; 12 Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009 Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)
	2.	Transient-induced latchup in CMOS integrated circuits / Ming-Dou Ker and Sheng-Fu Hsu. by Ker, Ming-Dou [author.] Hsu, Sheng-Fu John Wiley & Sons [publisher.] IEEE Xplore (Online service) [distributor.] Material type: Text; Format: available online Publisher: Singapore ; Wiley, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2010] Online access: Abstract with links to resource Availability: No items available. Found in Open Library: Add to cart (remove)

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