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Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma. by
- Sharma, Ashok K [author.]
- John Wiley & Sons [publisher.]
- IEEE Solid-State Circuits Council
- IEEE Xplore (Online service) [distributor.]
Material type: Text; Format:
available online
Publisher: Piscataway, New Jersey : IEEE Press, c1997Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2002]
Availability: No items available.
Found in Open Library:
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