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Software metrics and software metrology / Alain Abran. by
- Abran, Alain, 1949-
- IEEE Xplore (Online Service) [distributor.]
- John Wiley & Sons [publisher.]
Material type:  Text; Format:
available online
 Publisher: Los Alamitos, CA : IEEE Computer Society, c2010Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2010]
Availability: No items available.
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Software measurement and estimation : a practical approach / Linda M. Laird, M. Carol Brennan. by
- Laird, Linda M, 1952-
- Brennan, M. Carol, 1954-
- IEEE Xplore (Online Service) [distributor.]
- John Wiley & Sons [publisher.]
- IEEE Computer Society
- Books24x7, Inc
Series: Quantitative software engineering series ; 2
Material type: Text; Format:
available online
Publisher: Hoboken, New Jersey : John Wiley & Sons, 2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]
Availability: No items available.
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