Amazon cover image
Image from Amazon.com
Image from OpenLibrary
See Baker & Taylor
Image from Baker & Taylor

Sequential analysis: tests and confidence intervals/ David Siegmund.

By: Series: Springer series in statisticsPublication details: New York: Springer-Verlag, c1985.Description: xi, 272 p.: ill.; 25 cmISBN:
  • 0387961348
Subject(s): DDC classification:
  • 519.2 S571s
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Books Books Castorina Estantes Abertas (Open Shelves) Livros (Books) 519.2 S571s 1985 IMPA (Browse shelf(Opens below)) 1 Available 39063000118656

Includes index.

Bibliography: p. [263]-270.

There are no comments on this title.

to post a comment.
© 2023 IMPA Library | Customized & Maintained by Sérgio Pilotto


Powered by Koha