Statistical analysis of reliability and life-testing models: theory and methods/ Lee J. Bain.

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Series: Statistics, textbooks and monographs ; v. 24.Publication details: New York: M. Dekker, c1978.Description: xii, 450 p. ; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Castorina Estantes Abertas (Open Shelves)	Livros (Books)	519.5 B162s 1978 IMPA (Browse shelf(Opens below))	1	Available		39063000106859

Includes index.

Bibliography: p. 429-438.

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