Statistical methods for the reliability of repairable systems/ Steven E. Rigdon, Asit P. Basu.

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Series: Wiley series in probability and statisticsPublication details: New York: Wiley, 2000.Description: xii, 281 p.: ill.; 25 cmISBN:

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Collection	Call number	Status	Date due
Livros (Books)	519.5 R567s 2000 IMPA (Browse shelf(Opens below))	Available

"A Wiley-Interscience publication."

Includes bibliographical references (p. 267-275) and index.

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