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Phénomènes critiques, systèmes aléatoires, théories de jauge: Critical phenoniena, random systems, gauge theories/ édité par Konrad Osterwalder et Raymond Stora.

Contributor(s): Language: English Summary language: French Publication details: Amsterdam: Oxford: North-Holland, 1986.Description: 2 v. (xxxvii, 1199 p.): ill., ports.; 23 cmISBN:
  • 0444869808 :
  • 0444870067 (Pt.1) :
  • 0444870075 (Pt.2) :
Subject(s): DDC classification:
  • 530.1 P541
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Holdings
Item type Current library Collection Call number Vol info Copy number Status Date due Barcode
Books Books Castorina Estantes Abertas (Open Shelves) Livros (Books) 530.1 P541 1986 IMPA (Browse shelf(Opens below)) 1 1 Available 39063000148422
Books Books Castorina Estantes Abertas (Open Shelves) Livros (Books) 530.1 P541 1986 IMPA (Browse shelf(Opens below)) 2 1 Available 39063000148430

Includes French preface.

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