Single event effects in aerospace / (Record no. 40457)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 06346nam a2201345 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 6047596 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | IEEE |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230927112353.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr |n||||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 151221s2012 njua ob 001 eng d |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| Canceled/invalid LC control number | 2011002191 (print) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781118084328 |
| Qualifying information | ebook |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9781118084311 |
| Qualifying information | epub |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9781118084301 |
| Qualifying information | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9780470767498 |
| Qualifying information | hardback |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1002/9781118084328 |
| Source of number or code | doi |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaBNVSL)mat06047596 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (IDAMS)0b00006481692a6d |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | CaBNVSL |
| Language of cataloging | eng |
| Description conventions | rda |
| Transcribing agency | CaBNVSL |
| Modifying agency | CaBNVSL |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 629.1 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Petersen, Edward, |
| Dates associated with a name | 1932- |
| 245 10 - TITLE STATEMENT | |
| Title | Single event effects in aerospace / |
| Statement of responsibility, etc. | Edward Petersen. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Piscataway, New Jersey : |
| Name of producer, publisher, distributor, manufacturer | IEEE Press, |
| Date of production, publication, distribution, manufacture, or copyright notice | c2011. |
| 264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
| Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
| Date of production, publication, distribution, manufacture, or copyright notice | [2012] |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 PDF (xiii, 502 pages) : |
| Other physical details | illustrations. |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | electronic |
| Source | isbdmedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Source | rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references (p. 455-487) and indexes. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Introduction -- Foundations of Single Event Analysis and Prediction -- Optimizing Heavy Ion Experiments for Analysis -- Optimizing Proton Testing -- Data Qualification and Interpretation -- Analysis of Various Types of SEU Data -- Cosmic Ray Single Event Rate Calculations -- Proton Single Event Rate Calculations -- Neutron Induced Upset -- Upsets Produced by Heavy Ion Nuclear Reactions -- Samples of Heavy Ion Rate Prediction -- Samples of Proton Rate Predictions -- Combined Environments -- Samples of Solar Events and Extreme Situations -- Upset Rates in Neutral Particle Beam (NPB) Environments -- Predictions and Observations of SEU Rates in space -- Limitations of the IRPP Approach -- |
| 506 1# - RESTRICTIONS ON ACCESS NOTE | |
| Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:. Design of heavy ion and proton experiments to optimize the data needed for single event predictions. Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity. Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions. Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments. |
| 530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
| Additional physical form available note | Also available in print. |
| 538 ## - SYSTEM DETAILS NOTE | |
| System details note | Mode of access: World Wide Web |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electromagnetic pulse. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electronic apparatus and appliances |
| General subdivision | Effect of radiation on. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Astrionics |
| General subdivision | Protection. |
| 655 #0 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 695 ## - | |
| -- | Aerospace electronics |
| 695 ## - | |
| -- | Aerospace engineering |
| 695 ## - | |
| -- | Alpha particles |
| 695 ## - | |
| -- | Analytical models |
| 695 ## - | |
| -- | Approximation methods |
| 695 ## - | |
| -- | Atmospheric measurements |
| 695 ## - | |
| -- | Atmospheric modeling |
| 695 ## - | |
| -- | Belts |
| 695 ## - | |
| -- | CMOS integrated circuits |
| 695 ## - | |
| -- | Computers |
| 695 ## - | |
| -- | Correlation |
| 695 ## - | |
| -- | Cosmic rays |
| 695 ## - | |
| -- | Diffusion processes |
| 695 ## - | |
| -- | Dosimetry |
| 695 ## - | |
| -- | Earth |
| 695 ## - | |
| -- | Energy loss |
| 695 ## - | |
| -- | Equations |
| 695 ## - | |
| -- | Erbium |
| 695 ## - | |
| -- | Error analysis |
| 695 ## - | |
| -- | Exponential distribution |
| 695 ## - | |
| -- | Extraterrestrial measurements |
| 695 ## - | |
| -- | Fault tolerance |
| 695 ## - | |
| -- | Fault tolerant systems |
| 695 ## - | |
| -- | Field programmable gate arrays |
| 695 ## - | |
| -- | Force |
| 695 ## - | |
| -- | Gaussian distribution |
| 695 ## - | |
| -- | Geometry |
| 695 ## - | |
| -- | Helium |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Instruments |
| 695 ## - | |
| -- | Integrated circuit modeling |
| 695 ## - | |
| -- | Ionization |
| 695 ## - | |
| -- | Iron |
| 695 ## - | |
| -- | Junctions |
| 695 ## - | |
| -- | Lead |
| 695 ## - | |
| -- | Limiting |
| 695 ## - | |
| -- | Low earth orbit satellites |
| 695 ## - | |
| -- | MOS devices |
| 695 ## - | |
| -- | Mathematical model |
| 695 ## - | |
| -- | Measurement uncertainty |
| 695 ## - | |
| -- | Monitoring |
| 695 ## - | |
| -- | Monte Carlo methods |
| 695 ## - | |
| -- | NASA |
| 695 ## - | |
| -- | Neutrons |
| 695 ## - | |
| -- | Orbits |
| 695 ## - | |
| -- | Particle beam measurements |
| 695 ## - | |
| -- | Particle beams |
| 695 ## - | |
| -- | Power capacitors |
| 695 ## - | |
| -- | Probability |
| 695 ## - | |
| -- | Protons |
| 695 ## - | |
| -- | Radiation detectors |
| 695 ## - | |
| -- | Radiation effects |
| 695 ## - | |
| -- | Random access memory |
| 695 ## - | |
| -- | Scattering |
| 695 ## - | |
| -- | Sections |
| 695 ## - | |
| -- | Semiconductor device measurement |
| 695 ## - | |
| -- | Semiconductor device modeling |
| 695 ## - | |
| -- | Sensitivity |
| 695 ## - | |
| -- | Shape |
| 695 ## - | |
| -- | Silicon |
| 695 ## - | |
| -- | Single event upset |
| 695 ## - | |
| -- | Solids |
| 695 ## - | |
| -- | Space missions |
| 695 ## - | |
| -- | Space vehicles |
| 695 ## - | |
| -- | Systematics |
| 695 ## - | |
| -- | Testing |
| 695 ## - | |
| -- | Transient analysis |
| 695 ## - | |
| -- | Tungsten |
| 695 ## - | |
| -- | Weapons |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | IEEE Xplore (Online Service), |
| Relator term | distributor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
| Relator term | publisher. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| International Standard Book Number | 9780470767498 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Abstract with links to resource |
| Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6047596">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6047596</a> |
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