Accelerated stress testing handbook : (Record no. 40217)
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fixed length control field | 07831nam a2201525 i 4500 |
001 - CONTROL NUMBER | |
control field | 5270476 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | IEEE |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20230927112347.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr |n||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 100317t20152001nyua ob 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780470544051 |
Qualifying information | electronic |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780780360259 |
Qualifying information | |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 0470544058 |
Qualifying information | electronic |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1109/9780470544051 |
Source of number or code | doi |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (CaBNVSL)mat05270476 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (IDAMS)0b000064810cbddb |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | CaBNVSL |
Language of cataloging | eng |
Description conventions | rda |
Transcribing agency | CaBNVSL |
Modifying agency | CaBNVSL |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 620/.00452 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 658.5/7 |
245 00 - TITLE STATEMENT | |
Title | Accelerated stress testing handbook : |
Remainder of title | guide for achieving quality products / |
Statement of responsibility, etc. | edited by H. Anthony Chan, Paul J. Englert. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | New York : |
Name of producer, publisher, distributor, manufacturer | IEEE Press, |
Date of production, publication, distribution, manufacture, or copyright notice | c2001. |
264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
Date of production, publication, distribution, manufacture, or copyright notice | [2009] |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 PDF (xxii, 372 pages) : |
Other physical details | illustrations. |
336 ## - CONTENT TYPE | |
Content type term | text |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | electronic |
Source | isbdmedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Source | rdacarrier |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc. note | Includes bibliographical references (p. 340-363) and index. |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Foreword (F. Ianna). Preface. Acknowledgments. OVERVIEW. Introduction (H. Chan and P. Englert). Principles of Stress Testing (H. Chan and P. Englert). PROCESS AND GUIDELINES. Stress Testing Program: Generic Processes (H. Chan and P. Englert). Stress Testing Program Subprocesses (H. Chan and P. Englert). Guidelines for Design and Manufacturing Stress Testing (H. Chan and P. Englert). THEORY. Economic and Optimization (H. Chan and P. Englert). Reliability Growth (C. Seusy). Overview of the Failure Analysis Process for Electrical Components (G. Pfeiffer). EQUIPMENT AND TECHNIQUES. Accelerated Stress Testing Equipment and Techniques (C. Felkins). Vibration and Shock Inputs Identify Some Failure Modes (W. Tustin). Relative Effectiveness of Thermal Cycling Versus Burn-In (K. Lo and F. LoVasco). Accelerated Qualification of Electronic Assemblies Under Combined Temperature Cycling and Vibration Environments: Is Miner's Hypothesis Valid (K. Upadhyayula and A. Dasgupta)? Liquid Environmental Stress Testing (LEST) (P. Englert). Safety Qualification of Stress Testing (S. Rajaram). BEST PRACTICES CASE STUDIES IN COMPUTER, COMMUNICATIONS, AND OTHER INDUSTRIES. Production Ast with Computers Using the Taguchi Method (D. Pachuki). Design Ast with Vendor Electronics (C. Schinner). Design and Production Ast with Power Supplies (D. Dalland). Design and Production Ast with Computers (E. Kyser). Qualifications and Production Sampling Ast with Printed Circuit Boards (H. McLean). Manufacturing Ast with Telecommunication Products (T. Parker and G. Harrison). Production Ast with Computer Disks. Benchmarking (H. Malec). Glossary of Stress Testing Terminology. Bibliography. Index. Epilogue. About the Editors. |
506 1# - RESTRICTIONS ON ACCESS NOTE | |
Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's "toolbox" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include: . Theoretical basis for AST. General AST best practices. AST design and manufacturing processes. AST equipment and techniques. AST process safety qualification In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs. |
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
Additional physical form available note | Also available in print. |
538 ## - SYSTEM DETAILS NOTE | |
System details note | Mode of access: World Wide Web |
588 ## - SOURCE OF DESCRIPTION NOTE | |
Source of description note | Description based on PDF viewed 12/21/2015. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Electronic apparatus and appliances |
General subdivision | Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Electronic apparatus and appliances |
General subdivision | Reliability. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Environmental testing. |
655 #0 - INDEX TERM--GENRE/FORM | |
Genre/form data or focus term | Electronic books. |
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-- | Acceleration |
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-- | Approximation methods |
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-- | Assembly |
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-- | Availability |
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-- | Benchmark testing |
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-- | Bibliographies |
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-- | Biographies |
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-- | Books |
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-- | Business |
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-- | Central Processing Unit |
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-- | Companies |
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-- | Computer aided software engineering |
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-- | Computers |
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-- | Containers |
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-- | Cooling |
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-- | Databases |
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-- | Degradation |
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-- | Economics |
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-- | Electric shock |
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-- | Electronics industry |
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-- | Equations |
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-- | Failure analysis |
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-- | Fatigue |
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-- | Fixtures |
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-- | Guidelines |
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-- | Indexes |
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-- | Industries |
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-- | Integrated circuit interconnections |
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-- | Internet |
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-- | Lead |
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-- | Life estimation |
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-- | Liquids |
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-- | Load modeling |
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-- | Manufacturing |
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-- | Manufacturing processes |
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-- | Materials |
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-- | Mathematical model |
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-- | Monitoring |
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-- | Nitrogen |
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-- | Optical fibers |
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-- | Optimization |
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-- | Pediatrics |
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-- | Power supplies |
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-- | Power system reliability |
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-- | Principal component analysis |
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-- | Production |
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-- | Qualifications |
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-- | Random access memory |
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-- | Reliability |
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-- | Reliability engineering |
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-- | Reliability theory |
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-- | Resonant frequency |
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-- | Robustness |
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-- | Scanning electron microscopy |
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-- | Sensors |
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-- | Soldering |
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-- | Springs |
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-- | Stress |
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-- | Stress measurement |
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-- | Surface treatment |
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-- | Temperature control |
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-- | Temperature distribution |
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-- | Temperature measurement |
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-- | Temperature sensors |
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-- | Terminology |
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-- | Test equipment |
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-- | Testing |
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-- | Thermal analysis |
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-- | Thermal loading |
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-- | Thermal stresses |
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-- | Throughput |
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-- | Transient analysis |
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-- | Vibration measurement |
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-- | Vibrations |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Chan, H. Anthony, |
Dates associated with a name | 1952- |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Englert, Paul J, |
Dates associated with a name | 1960- |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
Relator term | publisher. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | IEEE Xplore (Online service), |
Relator term | distributor. |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Print version: |
International Standard Book Number | 9780780360259 |
856 42 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | Abstract with links to resource |
Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a> |
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