Silicon germanium : (Record no. 39966)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 05753nam a2200949 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5201823 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | IEEE |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230927112342.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr |n||||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 040320s2004 njua ob 001 eng d |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| Canceled/invalid LC control number | 2003057676 (print) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780471667209 |
| Qualifying information | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 047144653X |
| Qualifying information | paper |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 047166720X |
| Qualifying information | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9780471446538 |
| Qualifying information | |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1002/047166720X |
| Source of number or code | doi |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaBNVSL)mat05201823 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (IDAMS)0b0000648104ad8b |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | CaBNVSL |
| Language of cataloging | eng |
| Description conventions | rda |
| Transcribing agency | CaBNVSL |
| Modifying agency | CaBNVSL |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39/732 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Singh, Raminderpal, |
| Relator term | author. |
| 245 10 - TITLE STATEMENT | |
| Title | Silicon germanium : |
| Remainder of title | technology, modeling, and design / |
| Statement of responsibility, etc. | Raminderpal Singh, David Harame, Modest M. Oprysko. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Piscataway, New Jersey : |
| Name of producer, publisher, distributor, manufacturer | IEEE Press, |
| Date of production, publication, distribution, manufacture, or copyright notice | 2004. |
| 264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
| Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
| Date of production, publication, distribution, manufacture, or copyright notice | [2004] |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 PDF (xxviii, 340 pages) : |
| Other physical details | illustrations. |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | electronic |
| Source | isbdmedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Source | rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Contributors. -- Foreword. -- Preface. -- Acknowledgments. -- Introduction. -- A Historical Perspective at IBM. -- Technology Development. -- Modeling and Characterization. -- Design Automation and Signal Integrity. -- Leading-Edge Applications. -- Appendix. -- Index. -- About the Authors. -- |
| 506 1# - RESTRICTIONS ON ACCESS NOTE | |
| Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | "An excellent introduction to the SiGe BiCMOS technology, from the underlying device physics to current applications." -Ron Wilson, EETimes "SiGe technology has demonstrated the ability to provide excellent high-performance characteristics with very low noise, at high power gain, and with excellent linearity. This book is a comprehensive review of the technology and of the design methods that go with it." -Alberto Sangiovanni-Vincentelli Professor, University of California, Berkeley Cofounder, Chief Technology Officer, Member of Board Cadence Design Systems Inc. Filled with in-depth insights and expert advice, Silicon Germanium covers all the key aspects of this technology and its applications. Beginning with a brief introduction to and historical perspective of IBM's SiGe technology, this comprehensive guide quickly moves on to: * Detail many of IBM's SiGe technology development programs * Explore IBM's approach to device modeling and characterization-including predictive TCAD modeling * Discuss IBM's design automation and signal integrity knowledge and implementation methodologies * Illustrate design applications in a variety of IBM's SiGe technologies * Highlight details of highly integrated SiGe BiCMOS system-on-chip (SOC) design Written for RF/analog and mixed-signal designers, CAD designers, semiconductor students, and foundry process engineers worldwide, Silicon Germanium provides detailed insight into the modeling and design automation requirements for leading-edge RF/analog and mixed-signal products, and illustrates in-depth applications that can be implemented using IBM's advanced SiGe process technologies and design kits. "This volume provides an excellent introduction to the SiGe BiCMOS technology, from the underlying device physics to current applications. But just as important is the window the text provides into the infrastructure-the process development, device modeling, and tool development." -Ron Wilson Silicon Engineering Editor, EETimes "This book chronicles the development of SiGe in detail, provides an in-depth look at the modeling and design automation requirements for making advanced applications using SiGe possible, and illustrates such applications as implemented using IBM's process technologies and design methods." -John Kelly Senior Vice President and Group Executive, Technology Group, IBM. |
| 530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
| Additional physical form available note | Also available in print. |
| 538 ## - SYSTEM DETAILS NOTE | |
| System details note | Mode of access: World Wide Web |
| 550 ## - ISSUING BODY NOTE | |
| Issuing body note | Made available online by Ebrary. |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Title from title screen (viewed Aug. 17, 2004). |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Silicon. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Germanium. |
| 655 #0 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 695 ## - | |
| -- | BiCMOS integrated circuits |
| 695 ## - | |
| -- | Biographies |
| 695 ## - | |
| -- | Boron |
| 695 ## - | |
| -- | CMOS integrated circuits |
| 695 ## - | |
| -- | CMOS technology |
| 695 ## - | |
| -- | Clocks |
| 695 ## - | |
| -- | Computational modeling |
| 695 ## - | |
| -- | Design automation |
| 695 ## - | |
| -- | Electrostatic discharge |
| 695 ## - | |
| -- | Epitaxial growth |
| 695 ## - | |
| -- | FETs |
| 695 ## - | |
| -- | Hafnium |
| 695 ## - | |
| -- | Heterojunction bipolar transistors |
| 695 ## - | |
| -- | Impurities |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Integrated circuit interconnections |
| 695 ## - | |
| -- | Integrated circuit modeling |
| 695 ## - | |
| -- | Jitter |
| 695 ## - | |
| -- | Layout |
| 695 ## - | |
| -- | Metals |
| 695 ## - | |
| -- | Performance evaluation |
| 695 ## - | |
| -- | Phase locked loops |
| 695 ## - | |
| -- | Predictive models |
| 695 ## - | |
| -- | Radio frequency |
| 695 ## - | |
| -- | Resistors |
| 695 ## - | |
| -- | SONET |
| 695 ## - | |
| -- | Semiconductor device modeling |
| 695 ## - | |
| -- | Semiconductor process modeling |
| 695 ## - | |
| -- | Silicon |
| 695 ## - | |
| -- | Silicon germanium |
| 695 ## - | |
| -- | Solid modeling |
| 695 ## - | |
| -- | Transistors |
| 695 ## - | |
| -- | Voltage-controlled oscillators |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Oprysko, Modest Michael, |
| Dates associated with a name | 1957- |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Harame, David Louis. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | IEEE Xplore (Online Service), |
| Relator term | distributor. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
| Relator term | publisher. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| International Standard Book Number | 9780471446538 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Abstract with links to resource |
| Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201823">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201823</a> |
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